Waveguiding epitaxial potassium lithium niobate single-crystal films deposited by metalorganic chemical vapor deposition
被引:13
作者:
Chikuma, K
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机构:
Pioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, JapanPioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, Japan
Chikuma, K
[1
]
Onoe, A
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机构:
Pioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, JapanPioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, Japan
Onoe, A
[1
]
Yoshida, A
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Pioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, JapanPioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, Japan
Yoshida, A
[1
]
机构:
[1] Pioneer Elect Corp, Corp Res & Dev Labs, Tsurugashima, Saitama 3502288, Japan
来源:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
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1998年
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37卷
/
10期
Epitaxial potassium lithium niobate (KLN) single-crystal films were deposited on potassium lithium tantalate (KLT) singre-crystal substrates by low-pressure metalorganic chemical vapor deposition (MOCVD). Pentaethoxyniobium [Nb(OC2H5)(5)] and K and Li-dipivaloylmethane [K(DPM), Li(DPM)] were used as volatile metalorganic precursors. The crystallinity of the films was investigated by X-ray diffraction measurements. Reciprocal space mapping indicated that good epitaxial growth had been achieved. The film surface was smooth enough to act as a waveguide. Several guided modes were observed for both TE and TM waves by the prism coupler method. Refractive indices of the films for various wavelengths were determined and the phase matching property of the waveguide is discussed. The propagation loss, estimated by the cut-back method, was found to be 0.5 dB/cm at a wavelength of 633 nm.