All-photoplastic microstencil with self-alignment for multiple layer shadow-mask patterning

被引:34
作者
Kim, G
Kim, B
Brugger, J
机构
[1] Univ Twente, NanoLink Strateg Res Orientat, NL-7500 AE Enschede, Netherlands
[2] Univ Twente, MESA & Res Inst, NL-7500 AE Enschede, Netherlands
[3] Univ Tokyo, CIRMM, Inst Ind Sci, Tokyo 1538505, Japan
关键词
shadow-mask; photoplastic; membrane; multi-layer evaporation;
D O I
10.1016/S0924-4247(03)00298-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A rapid and simple method to fabricate tiny shadow-masks and their use in multi-layer surface patterning with in situ micromechanical alignment is presented. Instead of using silicon micromachining with through-wafer etching to define the thin membrane with etched apertures, we are using photoplastic SU-8-based resist as structural material of both membrane and support rim. Two layers, 5 and 150 mum thick, are structured by lithography and finally released from the surface. The free-standing SU-8 membranes have apertures ranging from 6 to 300 mum. They are placed and mechanically fixed to the surface, which needs to be patterned. Deposition by evaporation of Cr, An, Al or other material through the membrane apertures results in an accurate 1:1 replication of the aperture pattern. In view of multi-layer patterning, we used in situ micromechanical alignment pins or jigs and achieved an overlay precision of <2 mum in both x- and y-directions. The reusable shadow-masks allows for a low-cost surface patterning technique without the need for photolithography related process steps. It allows unconventional surfaces to be patterned in a rapid and vacuum-clean way on arbitrary surfaces. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:132 / 136
页数:5
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