An extended Butterworth-Van Dyke model for quartz crystal microbalance applications in viscoelastic fluid media

被引:40
作者
Arnau, A [1 ]
Jiménez, Y [1 ]
Sogorb, T [1 ]
机构
[1] Univ Politecn Valencia, ETSI Telecommun, E-46071 Valencia, Spain
关键词
D O I
10.1109/58.949746
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
An extended Butterworth-Van Dyke (EBVD) model with frequency-independent parameters for the characterization of a resonant compound formed by a quartz crystal in contact with a finite viscoelastic layer contacting a semi-infinite viscoelastic. medium is extracted by analysis of the lumped element model. The formulation of the EBVD model is compared with the complete expression of the electrical admittance of the loaded quartz derived from the transmission line model (TLM). Relative deviations between them do not exceed 3% around 1% bandwidth near resonance. An extended Martin & Granstaff's model and an explicit expression for the frequency shift that supposes an extension of Kanazawa's model for viscoelastic media are obtained. An analysis of the errors associated with the extraction of shear parameters of the coating for different materials prove that, to obtain an error less than 5% in the shear parameters determination, the viscoelastic contribution, defined as the relative error in the thickness computed from the frequency shift by Sauerbrey equation, must be greater than a limit that depends on Q, which is defined as the ratio of the shear storage modulus (G ') to shear loss modulus (G "). In the materials studied, polymers in the transition range or in the rubbery state with Q = 1 and 10, the viscoelastic contribution must be higher than 15% and 50%, respectively, for a 5% limit error in the shear parameters extraction. A criterion for a practical determination of the appropriate viscoelastic regimes is indicated.
引用
收藏
页码:1367 / 1382
页数:16
相关论文
共 43 条
[1]   Thickness-shear mode quartz crystal resonators in viscoelastic fluid media [J].
Arnau, A ;
Jiménez, Y ;
Sogorb, T .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (08) :4498-4506
[2]  
ARNAU A, 1999, THESIS POLYTECHNIC U
[3]   Viscoelastic characterization of electroactive polymer films at the electrode/solution interface [J].
Bandey, HL ;
Hillman, AR ;
Brown, MJ ;
Martin, SJ .
FARADAY DISCUSSIONS, 1997, 107 :105-121
[4]   In situ characterization of phospholipid coated electrodes [J].
Bartlett, PN ;
Brace, K ;
Calvo, EJ ;
Etchenique, R .
JOURNAL OF MATERIALS CHEMISTRY, 2000, 10 (01) :149-156
[5]   Response of quartz-crystal resonators to gas and liquid analyte exposure [J].
Behling, C ;
Lucklum, R ;
Hauptmann, P .
SENSORS AND ACTUATORS A-PHYSICAL, 1998, 68 (1-3) :388-398
[6]   Validation of antibody-based recognition by piezoelectric transducers through electroacoustic admittance analysis [J].
Bizet, K ;
Gabrielli, C ;
Perrot, H ;
Therasse, J .
BIOSENSORS & BIOELECTRONICS, 1998, 13 (3-4) :259-269
[7]  
Bottom V.E., 1982, INTRO QUARTZ CRYSTAL
[8]   Determination of the complex shear modulus of polymer solutions with piezoelectric resonators [J].
Bund, A ;
Chmiel, H ;
Schwitzgebel, G .
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1999, 1 (17) :3933-3938
[9]   Viscoelastic properties of low-viscosity liquids studied with thickness-shear mode resonators [J].
Bund, A ;
Schwitzgebel, G .
ANALYTICAL CHEMISTRY, 1998, 70 (13) :2584-2588
[10]   Validation of the frequency shift of thickness-shear-mode resonators in liquids - Determination of the activation energy of viscosity [J].
Bund, A ;
Schwitzgebel, G .
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1997, 101 (12) :1960-1962