Structure optimization of multi-state system with two failure modes

被引:54
作者
Levitin, G [1 ]
Lisnianski, A [1 ]
机构
[1] Israel Elect Corp Ltd, Dev & Technol Div, Reliabil Dept, IL-31000 Haifa, Israel
关键词
multi-state system; two failure modes; universal moment generating function; genetic algorithm;
D O I
10.1016/S0951-8320(00)00105-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
When systems with two failure modes (STFM) are considered, introducing redundant elements may either increase or decrease system reliability. Therefore the problem of system structure optimization arises. In this paper we consider systems consisting of elements characterized by different reliability and nominal performance rates. Such systems are multi-state because they can have different levels of output performance depending on the combination of elements available at the moment. The algorithm that determines the structure of multi-state STFM, which maximizes system reliability and/or expected performance is presented. In this algorithm, system elements are chosen from a list of available equipment. Reliability is defined as the probability of satisfaction of given constraints imposed on system performance in both modes. The procedure developed to solve this problem is based on the use of a universal moment generating function (UMGF) for the fast evaluation of multi-state system reliability and a genetic algorithm for optimization. Basic UMGF technique operators are developed for two different types of systems, based, respectively, on transmitting capacity and on processing time. Examples of the optimization of series-parallel structures of both types are presented. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:75 / 89
页数:15
相关论文
共 32 条
[11]   INCREASING THE RELIABILITY OF ELECTRONIC EQUIPMENT BY THE USE OF REDUNDANT CIRCUITS [J].
CREVELING, CJ .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1956, 44 (04) :509-515
[12]  
DHILLON B, 1986, MICROELECT RELIAB, V26, P525
[13]  
Gen M, 1999, COMPUT IND ENG, V37, P151, DOI 10.1016/S0360-8352(99)00043-1
[14]  
GEN M, 1997, GENETIC ALGORITHMS E
[15]   Genetic algorithms for reliability design problems [J].
Hsieh, YC ;
Chen, TC ;
Bricker, DL .
MICROELECTRONICS AND RELIABILITY, 1998, 38 (10) :1599-1605
[16]   OPEN AND SHORT-CIRCUIT RELIABILITY OF SYSTEMS OF IDENTICAL ITEMS [J].
JENNEY, BW ;
SHERWIN, DJ .
IEEE TRANSACTIONS ON RELIABILITY, 1986, 35 (05) :532-538
[17]   LINEAR PROGRAMMING AND RELIABILITY OF MULTICOMPONENT SYSTEMS [J].
KOLESAR, PJ .
NAVAL RESEARCH LOGISTICS QUARTERLY, 1967, 14 (03) :317-&
[18]   Structure optimization of power system with different redundant elements [J].
Levitin, G ;
Lisnianski, A ;
Elmakis, D .
ELECTRIC POWER SYSTEMS RESEARCH, 1997, 43 (01) :19-27
[19]   Joint redundancy and maintenance optimization for multistate series-parallel systems [J].
Levitin, G ;
Lisnianski, A .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 1999, 64 (01) :33-42
[20]   Redundancy optimization for series-parallel multi state systems [J].
Levitin, G ;
Lisnianski, A ;
Ben-Haim, H ;
Elmakis, D .
IEEE TRANSACTIONS ON RELIABILITY, 1998, 47 (02) :165-172