Digital signature proposal for mixed-signal circuits

被引：7

作者：

Brosa, AM

Figueras, J

机构：

[1] Infineon Technol AG, Mixed Signal Wireline Transcievers, D-81514 Munich, Germany

[2] Univ Politecn Cataluna, Dept Elect, E-08028 Barcelona, Spain

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2001年 / 17卷 / 05期

关键词：

analog test; mixed-signal test; BIST;

D O I：

10.1023/A:1012799001908

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new Built-In Self-Test structure, based on the information provided by the XY-operation (Lissajous curves) is introduced in this paper. A Digital Signature is obtained which is used to discriminate catastrophic as well as parametric defects. High Fault Coverage is achieved when applying the proposed BIST on an ITC'97 benchmark circuit where 92% of the catastrophic defects and 87.5% of the parametric defects analyzed produced digital signatures clearly distinguishable from the golden signature.

引用

页码：385 / 393

页数：9

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