Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

被引:28
作者
Davila, A [1 ]
Kaufmann, GH [1 ]
Perez-Lopez, C [1 ]
机构
[1] Ctr Invest Opt, Leon Guanajuanto 37150, Mexico
来源
APPLIED OPTICS | 1998年 / 37卷 / 19期
关键词
D O I
10.1364/AO.37.004116
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system. (C) 1998 Optical Society of America.
引用
收藏
页码:4116 / 4122
页数:7
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