Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

被引：28

作者：

Davila, A ^{[1
]}

Kaufmann, GH ^{[1
]}

Perez-Lopez, C ^{[1
]}

机构：

[1] Ctr Invest Opt, Leon Guanajuanto 37150, Mexico

来源：

APPLIED OPTICS | 1998年 / 37卷 / 19期

关键词：

D O I：

10.1364/AO.37.004116

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system. (C) 1998 Optical Society of America.

引用

页码：4116 / 4122

页数：7

共 12 条

[1]

BOONE P, 1969, OPT ACTA, V16, P555, DOI 10.1080/713818208

[2] Fast electro-optical system for pulsed ESPI carrier fringe generation [J].