Toward an absolute measurement of LIDT

被引：17

作者：

Natoli, JY ^{[1
]}

Gallais, L ^{[1
]}

Bertussi, B ^{[1
]}

Commandré, M ^{[1
]}

Amra, C ^{[1
]}

机构：

[1] Domaine Univ St Jerome, Ecole Natl Super Phys Marseille, Inst Fresnel, UMR 6133, F-13397 Marseille 20, France

来源：

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION | 2003年 / 4932卷

关键词：

laser damage threshold; silica; bulk and surface damage; damage testing process; localized study; test procedure; laser beam characterization;

D O I：

10.1117/12.472411

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The improvement of LIDT value of optical components had lead to develop a lot of experimental setups and procedures of test around the world. In this context it is often-very difficult to make accurate comparisons of laser damage threshold values between the different apparatus. The differences are due to the procedure of test, the spatial and temporal beam variations, the laser damage criterion and others. A specific laser damage testing apparatus, with an accurate damage initiation detection and allowing a real time acquisition of the different shot parameters, lead to exhibit the influence of each parameter on the damage process. Laser beam profiling is performed in real time and give access to the fluence for one pixel (0.24mum(2)), therefore an effective fluence or a pixel fluence can be calculated in order to reach an "absolute" threshold value. The metrology developed will be detailed and some results obtained on silica and BK7 at 1064nm and 355nm with different procedures of test will be presented and discussed to illustrate the aim of this study.

引用

页码：224 / 237

页数：14

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