A new approach to the analysis of SEU and SEL data to obtain the sensitive volume thickness

被引：16

作者：

Barak, J

Levinson, J

Akkerman, A

Hass, M

Victoria, M

Zentner, A

David, D

Even, O

Lifshitz, Y

机构：

[1] Soreq NRC, Yavne

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 03期

关键词：

D O I：

10.1109/23.510732

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

It is proposed to use short-range ions (along with long-range ions) to obtain the thickness of the sensitive volume, d, and the SEU and SEL cross sections vs the energy deposited in this volume, sigma(ion)(epsilon). These sigma(ion)(epsilon) and d can be used for calculating the proton induced cross sections sigma(p). A study of HM65162 demonstrates this method. The calculated sigma(p) is in good agreement with the experimental sigma(p).

引用

页码：907 / 911

页数：5

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