Fiber optic interferometry for precision measurement of the voltage and frequency dependence of the displacement of piezoelectric tubes

被引:35
作者
Chen, F [1 ]
Mohideen, U [1 ]
机构
[1] Univ Calif Riverside, Dept Phys, Riverside, CA 92521 USA
关键词
D O I
10.1063/1.1378341
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Piezoelectric tube scanners used in scanning microscopy show nonlinear displacements with applied voltage. We have used an optical fiber based interferometer to make precision measurements of these nonlinearities. We have made the measurement of the sensitivity coefficient (displacement/voltage) for a wide range of different scanning voltage ranges and scanning rates, and find that the sensitivity coefficient has nonlinearities of order 4% as a function of the applied voltage. A 3% frequency dependence of the sensitivity coefficient is also measured. A phenomenological model is used to characterize the frequency dependence on the basis of a single relaxation time constant. (C) 2001 American Institute of Physics.
引用
收藏
页码:3100 / 3102
页数:3
相关论文
共 13 条
  • [1] CORRECTION FOR NONLINEAR BEHAVIOR OF PIEZOELECTRIC TUBE SCANNERS USED IN SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY
    AKILA, J
    WADHWA, SS
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (03) : 2517 - 2519
  • [2] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
    BINNIG, G
    ROHRER, H
    GERBER, C
    WEIBEL, E
    [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
  • [3] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
  • [4] COMPUTER CORRECTION FOR DISTORTED STM IMAGES
    CAI, CZ
    CHEN, XY
    SHU, QQ
    ZHENG, XL
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (12) : 5649 - 5652
  • [5] Jona F., 1962, FERROELECTRIC CRYSTA
  • [6] Lines M. E., 1979, PRINCIPLES APPL FERR
  • [7] EASY METHOD TO CHARACTERIZE A PIEZOELECTRIC CERAMIC TUBE AS A DISPLACER
    LOCATELLI, M
    LAMBOLEY, G
    MICHENAUD, JP
    BAYOT, V
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (04) : 661 - 663
  • [8] Precision measurement of the Casimir force from 0.1 to 0.9 μm
    Mohideen, U
    Roy, A
    [J]. PHYSICAL REVIEW LETTERS, 1998, 81 (21) : 4549 - 4552
  • [9] RISS E, 1989, APPL PHYS LETT, V54, P2530
  • [10] Improved precision measurement of the Casimir force
    Roy, A
    Lin, CY
    Mohideen, U
    [J]. PHYSICAL REVIEW D, 1999, 60 (11):