Design and fabrication of integrated Si-based optoelectronic devices

被引:18
作者
Libertino, S
Coffa, S
Saggio, M
机构
[1] CNR, IMETEM, I-95121 Catania, Italy
[2] STMicroelect, I-95121 Catania, Italy
关键词
rare earth; Si-based; optoelectronic; LED;
D O I
10.1016/S1369-8001(00)00058-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have designed and fabricated novel Si-based optoelectronic devices. To this aim, different Si-based optical sources have been made and their performances at room temperature compared. Er-doped Si p-n junctions, operating at 1.54 mum and exhibiting an efficiency of 0.05% at room temperature, have been integrated with planar Si rib waveguides using either epitaxial Si or silicon on insulators (SOI) wafers. Optical characterization of these waveguides reveals very low transmission losses (below 1 dB/cm). However, Er-doping of the waveguide core, needed for the realization of the light source, results in a large increase of the losses as a consequence of absorption by the free electrons introduced by the rare earths. These losses can be suppressed when the junction is reverse biased and the whole Er profile is embodied in the depletion layer. Since this also allows efficient pumping of Er ions by hot carriers, the performances of the diodes and of the waveguides can be suitably combined. This optimized structure has also been used to design electrically pumped optical amplifiers and lasers, whose performances have been simulated. (C) 2001 Published by Elsevier Science Ltd.
引用
收藏
页码:375 / 381
页数:7
相关论文
共 10 条
[1]   Materials issues and device performances for light emitting Er-implanted Si [J].
Coffa, S ;
Priolo, F ;
Franzo, G ;
Polman, A ;
Libertino, S ;
Saggio, M ;
Carnera, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 106 (1-4) :386-392
[2]   Direct evidence of impact excitation and spatial profiling of excited Er in light emitting Si diodes [J].
Coffa, S ;
Franzo, G ;
Priolo, F ;
Pacelli, A ;
Lacaita, A .
APPLIED PHYSICS LETTERS, 1998, 73 (01) :93-95
[3]  
COFFA S, 1998, MRS B, V23
[4]  
COFFA S, IN PRESS IEEE J QUAN
[5]   THE EFFECTS OF OXYGEN AND DEFECTS ON THE DEEP-LEVEL PROPERTIES OF ER IN CRYSTALLINE SI [J].
LIBERTINO, S ;
COFFA, S ;
FRANZO, G ;
PRIOLO, F .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (06) :3867-3873
[6]  
Saleh B. E. A., 1991, FUNDAMENTAL PHOTONIC
[7]   SILICON-BASED OPTOELECTRONICS [J].
SOREF, RA .
PROCEEDINGS OF THE IEEE, 1993, 81 (12) :1687-1706
[8]  
Svelto O., 1998, Principles of Lasers
[9]   Hot electron impact excitation cross-section of Er3+ and electroluminescence from erbium-implanted silicon metal-oxide-semiconductor tunnel diodes [J].
Wang, S ;
Eckau, A ;
Neufeld, E ;
Carius, R ;
Buchal, C .
APPLIED PHYSICS LETTERS, 1997, 71 (19) :2824-2826
[10]  
XIE YH, 1991, J APPL PHYS, V70, P3233