Travelling wave based fault location for teed circuits

被引：162

作者：

Evrenosoglu, CY ^{[1
]}

Abur, A ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Elect Engn, College Stn, TX 77843 USA

来源：

IEEE TRANSACTIONS ON POWER DELIVERY | 2005年 / 20卷 / 02期

基金：

美国国家科学基金会;

关键词：

electromagnetic transients simulations; fault location; frequency dependent line model; mutual coupled lines; series compensation; teed circuits; wavelet transform;

D O I：

10.1109/TPWRD.2004.834303

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a fault location algorithm for three terminal lines using wavelet transform of the fault initiated transients. The results presented in [1] are extended to the case of three terminal configuration and a new single ended procedure is developed for teed circuits. The algorithm gives accurate results for the case of three terminal lines including series compensated branch, mutual coupled line section and different values of fault resistances. The performance of the algorithm is tested on different scenarios by using ATP/EMTP program and MATLAB Wavelet Toolbox.

引用

页码：1115 / 1121

页数：7

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