XPS study of NbN and (NbTi)N superconducting coatings

被引:86
作者
Jouve, G
Severac, C
Cantacuzene, S
机构
[1] UNIV PARIS 11,CNRS UA 1107,MET STRUCT LAB,F-91405 ORSAY,FRANCE
[2] CENS,CEA,SERV ETUD ACCELERATEURS,DAPNIA,F-91191 GIF SUR YVETTE,FRANCE
关键词
X-ray photoelectron spectroscopy; coatings; surface composition; nitrides; niobium;
D O I
10.1016/S0040-6090(96)08776-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The chemical composition of the various compounds present in the surface region of NbN and (NbTi)N coatings is studied by X-ray photoelectron spectroscopy. The high in-depth resolution of this technique enables one to investigate the spacial distribution of various phases within the surface layer, by varying the take-off angle of photoelectrons. Nb2O5 oxide covers the surface of the NbN coating, while an intermediate oxynitride compound is localized between Nb2O5 and NbN bulk. TiO2 bonds are present in the outer part of the surface layer of (NbTi)N coatings. The unique intermediate oxynitride phase which is present on NbN is split into two different oxynitride energies on (NbTi)N. In both coatings, oxynitride bonds are not found throughout the bulk, although it contains 0.7% oxygen atoms as impurity.
引用
收藏
页码:146 / 153
页数:8
相关论文
共 22 条
[1]  
BANTISTA JJ, 1985, IEEE T MAGN, V21, P640
[2]  
BERNARD P, 1993, P 6 WORKSH RF SUP CE
[3]  
BOSLAND P, 1993, 6 WORKSH RF SUP CEBA
[4]   A CORRELATION OF AUGER-ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON-SPECTROSCOPY, AND RUTHERFORD BACKSCATTERING SPECTROMETRY MEASUREMENTS ON SPUTTER-DEPOSITED TITANIUM NITRIDE THIN-FILMS [J].
BURROW, BJ ;
MORGAN, AE ;
ELLWANGER, RC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2463-2469
[5]  
CANTACUZENE S, 1995, THESIS PARIS 11
[6]  
DARLINSKI A, 1987, SURF INTER ANAL, V1, P223
[7]   PHOTOEMISSION-STUDY OF THE ELECTRONIC-STRUCTURE OF STOICHIOMETRIC AND SUBSTOICHIOMETRIC TIN AND ZRN [J].
HOCHST, H ;
BRINGANS, RD ;
STEINER, P ;
WOLF, T .
PHYSICAL REVIEW B, 1982, 25 (12) :7183-7191
[8]   CHARACTERIZATION OF NITRIDE COATINGS BY AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
HOFMANN, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06) :2789-2796
[9]  
Hofmann S, 1982, J TRACE MICROPROBE T, V1, P213
[10]   X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF PHOSPHORUS INCORPORATION IN ANODIC OXIDE-FILMS ON NIOBIUM [J].
JOUVE, J ;
BELKACEM, Y ;
SEVERAC, C .
THIN SOLID FILMS, 1986, 139 (01) :67-75