Symmetry breaking in few layer graphene films

被引：157

作者：

Bostwick, Aaron

Ohta, Taisuke

McChesney, Jessica L.

Emtsev, Konstantin V.

Seyller, Thomas

Horn, Karsten

Rotenberg, Eli ^{[1
]}

机构：

[1] EO Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA

[2] Max Planck Gesell, Fritz Haber Inst, Dept Mol Phys, D-14195 Berlin, Germany

[3] Montana State Univ, Dept Phys, Bozeman, MT 59717 USA

[4] Univ Erlangen Nurnberg, Lehrstuhl Tech, Inst Phys Kondensierten Mat, D-91058 Erlangen, Germany

来源：

NEW JOURNAL OF PHYSICS | 2007年 / 9卷

关键词：

D O I：

10.1088/1367-2630/9/10/385

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Recently, it was demonstrated that the quasiparticle dynamics, the layer-dependent charge and potential, and the c-axis screening coefficient could be extracted from measurements of the spectral function of few layer graphene films grown epitaxially on SiC using angle-resolved photoemission spectroscopy (ARPES). In this paper we review these findings, and present detailed methodology for extracting such parameters from ARPES. We also present detailed arguments against the possibility of an energy gap at the Dirac crossing E-D.

引用

页数：22

共 57 条

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