Nanostructured copper filaments in electrochemical deposition

被引:93
作者
Wang, M [1 ]
Zhong, S
Yin, XB
Zhu, JM
Peng, RW
Wang, Y
Zhang, KQ
Ming, NB
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
关键词
D O I
10.1103/PhysRevLett.86.3827
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this Letter we report a novel self-organized copper electrodeposition in an ultrathin layer of CuSO4 electrolyte. The macroscopic fingering branches of the deposit consist of long copper filaments covered with periodic corrugated nanostructures. The mechanism of the nanostructure formation is explored and the origin of the significant descent of the branching rate in electrodeposition is discussed. We suggest that this growth phenomenon provides deeper insights into the role of diffusion and migration on pattern formation in electrodepositisn.
引用
收藏
页码:3827 / 3830
页数:4
相关论文
共 25 条
  • [1] CHEMICAL EFFECTS ON THE MORPHOLOGY OF SUPPORTED ELECTRODEPOSITED METALS
    ATCHISON, SN
    BURFORD, RP
    HIBBERT, DB
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1994, 371 (1-2): : 137 - 148
  • [2] In situ electrochemical quartz crystal microbalance study of potential oscillations during the electrodeposition of Cu/Cu2O layered nanostructures
    Bohannan, EW
    Huang, LY
    Miller, FS
    Shumsky, MG
    Switzer, JA
    [J]. LANGMUIR, 1999, 15 (03) : 813 - 818
  • [3] Creating electrical contacts between metal particles using directed electrochemical growth
    Bradley, JC
    Chen, HM
    Crawford, J
    Eckert, J
    Ernazarova, K
    Kurzeja, T
    Lin, MD
    McGee, M
    Nadler, W
    Stephens, SG
    [J]. NATURE, 1997, 389 (6648) : 268 - 271
  • [4] ELECTROCHEMICAL ASPECTS OF THE GENERATION OF RAMIFIED METALLIC ELECTRODEPOSITS
    CHAZALVIEL, JN
    [J]. PHYSICAL REVIEW A, 1990, 42 (12): : 7355 - 7367
  • [5] FINGERING INSTABILITY OF GRAVITY CURRENTS IN THIN-LAYER ELECTROCHEMICAL DEPOSITION
    DEBRUYN, JR
    [J]. PHYSICAL REVIEW LETTERS, 1995, 74 (24) : 4843 - 4846
  • [6] Full copper wiring in a sub-0.25 μm CMOS ULSI technology
    Edelstein, D
    Heidenreich, J
    Goldblatt, R
    Cote, W
    Uzoh, C
    Lustig, N
    Roper, P
    McDevitt, T
    Motsiff, W
    Simon, A
    Dukovic, J
    Wachnik, R
    Rathore, H
    Schulz, R
    Su, L
    Luce, S
    Slattery, J
    [J]. INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST, 1997, : 773 - 776
  • [7] COMPUTER-SIMULATIONS OF DENSE-BRANCHING PATTERNS
    ERLEBACHER, J
    SEARSON, PC
    SIERADZKI, K
    [J]. PHYSICAL REVIEW LETTERS, 1993, 71 (20) : 3311 - 3314
  • [8] MECHANISM OF A MORPHOLOGY TRANSITION IN RAMIFIED ELECTROCHEMICAL GROWTH
    FLEURY, V
    KAUFMAN, JH
    HIBBERT, DB
    [J]. NATURE, 1994, 367 (6462) : 435 - 438
  • [9] Branched fractal patterns in non-equilibrium electrochemical deposition from oscillatory nucleation and growth
    Fleury, V
    [J]. NATURE, 1997, 390 (6656) : 145 - 148
  • [10] FLEURY V, 1995, DEFECT STRUCTURE, MORPHOLOGY AND PROPERTIES OF DEPOSITS, P195