YBCO thin films on multilayers prepared by all-chemical solution deposition processing

被引：7

作者：

Hiei, H

Yamagiwa, K

Takahashi, Y

Kim, SB

Yamada, Y

Shibata, J

Hirayama, T

Ikuta, H

Hirabayashi, I

Mizutani, U

机构：

[1] Nagoya Univ, Dept Crystalline Mat Sci, Chikusa Ku, Nagoya, Aichi 4648603, Japan

[2] ISTEC, SRL, Div 5, Atsuta Ku, Nagoya, Aichi 4568587, Japan

[3] Japan Fine Ceram Ctr, Atsuta Ku, Nagoya, Aichi 4568587, Japan

[4] Nagoya Univ, CIRSE, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

PHYSICA C | 2001年 / 357卷

关键词：

YBa2Cu3O7-delta; multilayer structures; all-chemical solution deposition process;

D O I：

10.1016/S0921-4534(01)00448-8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The chemical solution deposition (CSD) technique has been applied to prepare both YBa2Cu3O7-delta (YBCO) and buffer layers on a YSZ substrate. Y2O3 and CeO2 Were employed as the buffer layers, and it was confirmed that they grew epitaxially by the CSD method. Cross-sectional transmission electron microscope observations revealed that Y2O3 grew up to the top of the film. Furthermore, the YBCO film on the Y2O3 or CeO2/Y2O3 layers were c-axis aligned and showed a good in-plane alignment. The transition temperature and the critical current density of the Y-BCO/Y2O3/YSZ multilayer were 89 K and 4 x 10(4) A/cm(2) at 77 K, 0 T, respectively. (C) 2001 Elsevier Science B.V. All rights reserved.

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页码：942 / 945

页数：4

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