Combined AFM and laser lithography on hydrogen-passivated amorphous silicon

被引:4
作者
Birkelund, K [1 ]
Mullenborn, M [1 ]
Grey, F [1 ]
Jensen, F [1 ]
Madsen, S [1 ]
机构
[1] DANISH MICRO ENGN AS,DK-2730 HERLEV,DENMARK
关键词
nanolithography; hydrogen passivated silicon; scanning probe microscopes;
D O I
10.1006/spmi.1996.0114
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We report a novel combination of AFM lithography and laser direct writing on hydrogen-passivated amorphous silicon surfaces to fabricate combined silicon milli-, micro- and nanostructures. Selective oxidation is performed by focusing a laser beam (lambda = 458 nm) on a hydrogen-terminated silicon surface, forming the millimetre-size contact pads for connection of nanometre-scale patterns. The nanostructures are made by electric-field-enhanced oxidation using a contact mode AFM equipped with a metal-coated tip. Both techniques are based on selective oxidation of hydrogen-passivated amorphous silicon, where the oxide is used as an etch mask in a single etch step. The lithographic process has also been demonstrated using a reflection mode scanning near-field optical microscope with an uncoated fiber probe. (C) 1996 Academic Press Limited
引用
收藏
页码:555 / 560
页数:6
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