X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. I. Specular reflectivity

被引:68
作者
Lee, DR [1 ]
Sinha, SK
Haskel, D
Choi, Y
Lang, JC
Stepanov, SA
Srajer, G
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[2] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA
[3] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[4] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
关键词
D O I
10.1103/PhysRevB.68.224409
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The theoretical formulation of x-ray resonant magnetic scattering from rough surfaces and interfaces is given for specular reflectivity. A general expression is derived for both structurally and magnetically rough interfaces in the distorted-wave Born approximation as the framework of the theory. For this purpose, we have defined a "structural" and a "magnetic" interface to represent the actual interfaces. A generalization of the well-known Nevot-Croce formula for specular reflectivity is obtained for the case of a single rough magnetic interface using the self-consistent method. Finally, the results are generalized to the case of multiple interfaces, as in the case of thin films or multilayers. Theoretical calculations for each of the cases are illustrated with numerical examples and compared with experimental results of magnetic reflectivity from a Gd/Fe multilayer.
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页数:19
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