Erbium doped PZT and multilayer structures for pyroelectric applications

被引:4
作者
Es-Souni, A [1 ]
Zhang, N [1 ]
机构
[1] Univ Appl Sci, Inst Mat & Surface Technol, D-24149 Kiel, Germany
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2004年 / 106卷 / 01期
关键词
PZT; multilayer heterostructures; dielectric properties; pyroelectric properties;
D O I
10.1016/j.mseb.2003.09.008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of erbium doped Pb(Zr0.35Ti0.65)O-3 (PEZT 52) and Pb(Zr0.52Ti0.48)O-3 (PEZT 52) as well as their multilayer heterostructures PEZT35/PEZT52 were processed on platinized Silicon substrates via solution deposition. The results of microstructure, ferroelectric, dielectric and pyroelectric properties are reported. It is shown that heterostructures can be successfully used to tune the dielectric and pyroelectric properties. The figure of merit for pyroelectric applications calculated for all films are found to be substantially lower than that of modified PZT ceramics because of the higher dielectric constants and loss tangents obtained. The voltage and current responses of the detector elements measured using a modulated laser source and a lock-in amplifier show better results for PEZT35 at low frequencies. A pyrovoltage output amplitude of up to 1 mV could be obtained on unpoled specimens, using platinum top electrodes. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:79 / 84
页数:6
相关论文
共 11 条
[1]   Pyroelectric and sensor properties of ferroelectric thin films for energy conversion [J].
Buchanan, RC ;
Huang, J .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1999, 19 (6-7) :1467-1471
[2]   Diffuse phase transition in epitaxial BaTiO3 thin films [J].
Chattopadhyay, S ;
Teren, AR ;
Hwang, JH ;
Mason, TO ;
Wessels, BW .
JOURNAL OF MATERIALS RESEARCH, 2002, 17 (03) :669-674
[3]   Microstructure and properties of solution deposited, Nb-doped PZT thin films [J].
Es-Souni M. ;
Piorra A. ;
Solterbeck C.-H. ;
Iakovlev S. ;
Abed M. .
Journal of Electroceramics, 2002, 9 (2) :125-135
[4]  
ESSOUNI M, 2003, IN PRESS J EUR CERAM
[5]   Dielectric and pyroelectric properties of PZFNT/PZT bimorph thin films [J].
Iakovlev, S ;
Solterbeck, CH ;
Piorra, A ;
Es-Souni, M .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2003, 14 (03) :143-148
[6]   Substrate effects on the properties of the pyroelectric thin film IR detectors [J].
Ko, JS ;
Liu, WG ;
Zhu, WG .
SENSORS AND ACTUATORS A-PHYSICAL, 2001, 93 (02) :117-122
[7]   Effects of thickness on the piezoelectric and dielectric properties of lead zirconate titanate thin films [J].
Lian, L ;
Sottos, NR .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (08) :3941-3949
[8]  
MOULSON AJ, 1990, ELECTROCERAMICS, P320
[9]   Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi4Ti3O12 thin films [J].
Park, BH ;
Hyun, SJ ;
Moon, CR ;
Choe, BD ;
Lee, J ;
Kim, CY ;
Jo, W ;
Noh, TW .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (08) :4428-4435
[10]   Ferroelectric thin films in microelectromechanical systems applications [J].
Polla, DL ;
Francis, LF .
MRS BULLETIN, 1996, 21 (07) :59-65