The influence of scattering processes in quantitative X-ray fluorescence analysis

被引：5

作者：

Bos, M ^{[1
]}

Vrielink, JAM ^{[1
]}

机构：

[1] Univ Twente, Fac Sci & Technol, NL-7500 AE Enschede, Netherlands

来源：

ANALYTICA CHIMICA ACTA | 2005年 / 545卷 / 01期

关键词：

quantitative XRF Rayleigh compton scattering;

D O I：

10.1016/j.aca.2005.04.009

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：92 / 98

页数：7

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