1800 V NPN bipolar junction transistors in 4H-SiC

被引:147
作者
Ryu, SH [1 ]
Agarwal, AK [1 ]
Singh, R [1 ]
Palmour, JW [1 ]
机构
[1] Cree Inc, Durham, NC 27703 USA
关键词
4H-silicon carbide; bipolar junction transistor; high voltage; temperature-stable current gain;
D O I
10.1109/55.910617
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The first high voltage npn bipolar junction transistors (BJTs) in 4H-SiC have been demonstrated. The BJTs were able to block 1800 V in common emitter mode and showed a peak current gain of 20 and an on-resistance of 10.8 m Omega .cm(2) at room temperature (I-C = 2.7 A @ V-CE = 2 V for a 1 mm x 1.4 mm active area), which outperforms all SIC power switching devices reported to date. Temperature-stable current gain was observed for these devices. This is due to the higher percent ionization of the deep level acceptor atoms in the base region at elevated temperatures, which offsets the effects of increased minority carrier lifetime at high temperatures. These transistors show a positive temperature coefficient in the on-resistance characteristics, which mill enable easy paralleling of the devices.
引用
收藏
页码:124 / 126
页数:3
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