共 8 条
[1]
Attwood D., 1999, SOFT XRAYS EXTREME U
[3]
Goldberg K.A, 1997, THESIS U CALIFORNIA
[7]
At-wavelength interferometry for extreme ultraviolet lithography
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1997, 15 (06)
:2455-2461
[8]
2002, Patent No. 0202495