Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions

被引:53
作者
Attwood, DT [1 ]
Naulleau, P
Goldberg, KA
Tejnil, E
Chang, C
Beguiristain, R
Batson, P
Bokor, J
Gullikson, EM
Koike, M
Medecki, H
Underwood, JH
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Xray Opt, Div Mat Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[3] Intel Corp, Santa Clara, CA USA
[4] Japan Atom Energy Res Inst, Kyoto, Japan
关键词
coherent radiation; extreme ultraviolet; radiation; soft X-rays; undulator;
D O I
10.1109/3.760317
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Undulator radiation, generated by relativistic electrons traversing a periodic magnet structure, can provide a continuously tunable source of very bright and partially coherent radiation in the extreme ultraviolet (EUV), soft X-ray (SXR), and X-ray regions of the electromagnetic spectrum. Typically, 1-10 W are radiated within a 1/N relative spectral bandwidth, where N is of order 100, Monochromators are frequently used to narrow the spectral bandwidth and increase the longitudinal coherence length, albeit with a more than proportionate loss of power. Pinhole spatial filtering is employed to provide spatially coherent radiation at a power level determined by the wavelength, electron beam, and undulator parameters. In this paper, experiments are described in which broadly tunable, spatially coherent power is generated at EUV and soft X-ray wavelengths extending from about 3 to 16 nm (80-430-eV photon energies). Spatially coherent power of order 10 mu W is achieved in a relative spectral bandwidth of 9 x 10(-4), with 1.90-GeV electrons traversing an 8-cm period undulator of 55 periods. This radiation has been used in 13.4-nm interferometric tests that achieve an rms wavefront error (departure from sphericity) of lambda(euv)/330, These techniques scale in a straightforward manner to shorter soft X-ray wavelengths using 4-5-cm period undulators at 1.90 GeV and to X-ray wavelengths of order 0.1 nm using higher energy (6-8 GeV) electron beams at other facilities.
引用
收藏
页码:709 / 720
页数:12
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