Raman studies on GaAs1-xBix and InAs1-xBix

被引:61
作者
Verma, P [1 ]
Oe, K
Yamada, M
Harima, H
Herms, M
Irmer, G
机构
[1] Kyoto Inst Technol, Dept Elect & Informat Sci, Kyoto 6068585, Japan
[2] Osaka Univ, Dept Appl Phys, Suita, Osaka 5650871, Japan
[3] Fraunhofer Inst Nondestruct Testing, D-01326 Dresden, Germany
[4] TU Bergakad Freiberg, Inst Theoret Phys, D-09596 Freiberg, Germany
关键词
D O I
10.1063/1.1336561
中图分类号
O59 [应用物理学];
学科分类号
摘要
The lattice vibrational properties of new semiconductor alloys, GaAs1-xBix and InAs1-xBix, are reported. These alloys, which were grown by metalorganic vapor phase epitaxy technique, contain a small amount (1.2%-3.8%) of Bi. A detail Raman scattering study of these new alloys, which exhibit weak temperature dependence of the band gap with increasing amount of Bi, is reported here. Good crystalline quality and spatial homogeneity was confirmed using micro-Raman technique. The alloys show ternary compound behavior, confirming substitutional incorporation of Bi into the lattice site. New vibrational modes observed were assigned to GaBi-like and InBi-like modes. In addition, phonon-plasmon coupled modes and vibrational modes corresponding to Bi and As materials were also observed. Results are discussed to characterize these new alloys in detail. (C) 2001 American Institute of Physics.
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页码:1657 / 1663
页数:7
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