A high resolution photoemission study of phenol adsorption on Si(100)2 x 1

被引:37
作者
Casaletto, MP
Carbone, M
Piancastelli, MN
Horn, K
Weiss, K
Zanoni, R
机构
[1] CNR, Ist Studio Mat Nanostrtturati, I-90146 Palermo, Italy
[2] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, Rome, Italy
[3] Max Planck Gesell, Fritz Haber Inst, Dept Mol Phys, D-1000 Berlin, Germany
[4] Univ Roma La Sapienza, Dipartimento Chim, I-00185 Rome, Italy
关键词
silicon; single crystal surface; phenol adsorption; high resolution core-level photoemission; synchrotron radiation photoelectron spectroscopy; surface chemical reaction;
D O I
10.1016/j.susc.2005.03.004
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The adsorption of a bi-functional organic molecule like phenol on Si(100)2 x 1 has been investigated by synchrotron radiation-induced photoemission in the valence band, Si 2p, C 1s and O 1s core-level regions. Experiments have been carried out as a function of phenol exposure at room temperature. Phenol adsorbs on Si(100)2 x 1 through a dissociative mechanism at room temperature, interacting with the surface by its alcoholic functionality. The line-shape analysis of Si 2p spectra indicates the formation of Si-O and Si-H bonds, as a consequence of the cleavage of the C6H5O-H bond and the binding of the fragments (C6H5O-group and H atom) to the Si(100)2 x 1 surface dimers. The progressive quenching of the silicon surface dimer atoms and the corresponding intensity increase of the Si-OC6H5 and Si-H components have been observed as a function of phenol exposure. The presence of the phenoxide (C6H5O-) group on the silicon surface has been evidenced also by the C 1s spectrum, consisting of two components in a 1:5 intensity ratio, energy splitted by 1.5 eV, which can be assigned to carbon atom linked to oxygen (C-O group) and carbon atoms of the aromatic ring, respectively. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:42 / 48
页数:7
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