Autonomic Restoration of Electrical Conductivity

被引：269

作者：

Blaiszik, Benjamin J. ^{[1
]}

Kramer, Sharlotte L. B. ^{[1
]}

Grady, Martha E. ^{[2
]}

McIlroy, David A. ^{[1
]}

Moore, Jeffrey S. ^{[3
]}

Sottos, Nancy R. ^{[1
]}

White, Scott R. ^{[4
]}

机构：

[1] Univ Illinois, Beckman Inst Adv Sci & Technol, Dept Mat Sci & Engn, Urbana, IL 61801 USA

[2] Univ Illinois, Dept Mech Sci & Engn, Urbana, IL 61801 USA

[3] Univ Illinois, Beckman Inst Adv Sci & Technol, Dept Chem, Urbana, IL 61801 USA

[4] Univ Illinois, Beckman Inst Adv Sci & Technol, Dept Aerosp Engn, Urbana, IL 61801 USA

来源：

ADVANCED MATERIALS | 2012年 / 24卷 / 03期

关键词：

stimuli-responsive materials; self-healing materials; microelectronics; electrical conductivity; SELF-HEALING MATERIALS; GALLIUM-INDIUM EGAIN; LIQUID-METAL; INTEGRATION; CIRCUITS; FAILURE; ALLOY;

D O I：

10.1002/adma.201102888

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Self-healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium-indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).

引用

页码：398 / +

页数：5

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