FitGISAXS: software package for modelling and analysis of GISAXS data using IGOR Pro

被引:143
作者
Babonneau, David [1 ]
机构
[1] Univ Poitiers, CNRS, UPR 3346, Dept Phys & Mecan Mat,Inst P,SP2MI, F-86962 Chasseneuil, France
关键词
X-RAY-SCATTERING; WAVE BORN APPROXIMATION; SMALL-ANGLE SCATTERING; IN-SITU GISAXS; GRAZING-INCIDENCE; SIZE DISTRIBUTIONS; CROSS-SECTION; THIN-FILMS; CLUSTERS; MULTILAYERS;
D O I
10.1107/S0021889810020352
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A software package for performing modelling and analysis of GISAXS (grazing-incidence small-angle X-ray scattering) data within the distorted-wave Born approximation has been developed using the IGOR Pro scripting language (http://www.wavemetrics.com). The tool suite uses a slab-model approach with the Abeles matrix method to calculate X-ray reflectivity curves, electric field intensity distributions and GISAXS intensities from supported or buried scatterers arranged in two or three dimensions in a stratified medium. Models are included to calculate the scattered intensity for monodisperse, polydisperse and interacting particles with various size distributions, form factors and structure factors. The source code for the entire package is freely available, allowing anyone to develop additional tools.
引用
收藏
页码:929 / 936
页数:8
相关论文
共 58 条
[1]  
Abeles F., 1950, Ann. de Physique, V5, P596, DOI DOI 10.1051/ANPHYS/195012050596
[2]  
Abeles F., 1950, ANN PHYS-PARIS, V5, P706
[3]   Grazing incidence small-angle x-ray scattering from defects induced by helium implantation in silicon [J].
Babonneau, D ;
Beaufort, MF ;
Declémy, A ;
Barbot, JF ;
Simon, JP .
JOURNAL OF APPLIED PHYSICS, 2006, 99 (11)
[4]   Morphological characterization of ion-sputtered C-Ag C/C-Ag and Ag/C films by GISAXS [J].
Babonneau, D ;
Naudon, A ;
Thiaudière, D ;
Lequien, S .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 :226-233
[5]   Waveguiding and correlated roughness effects in layered nanocomposite thin films studied by grazing-incidence small-angle x-ray scattering [J].
Babonneau, D. ;
Camelio, S. ;
Lantiat, D. ;
Simonot, L. ;
Michel, A. .
PHYSICAL REVIEW B, 2009, 80 (15)
[6]   Effects of thermal annealing on C/FePt granular multilayers:: in situ and ex situ studies [J].
Babonneau, D. ;
Abadias, G. ;
Toudert, J. ;
Girardeau, T. ;
Fonda, E. ;
Micha, J. S. ;
Petroff, F. .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2008, 20 (03)
[7]   GISAXS study of cavities and {113} defects induced by neon and helium implantation in silicon [J].
Babonneau, David ;
Peripolli, Suzana ;
Beaufort, Marie-France ;
Barbot, Jean-Francois ;
Simon, Jean-Paul .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2007, 40 :S350-S354
[8]   Cell-directed assembly of lipid-silica nanostructures providing extended cell viability [J].
Baca, Helen K. ;
Ashley, Carlee ;
Carnes, Eric ;
Lopez, Deanna ;
Flemming, Jeb ;
Dunphy, Darren ;
Singh, Seema ;
Chen, Zhu ;
Liu, Nanguo ;
Fan, Hongyou ;
Lopez, Gabriel P. ;
Brozik, Susan M. ;
Werner-Washburne, Margaret ;
Brinker, C. Jeffrey .
SCIENCE, 2006, 313 (5785) :337-341
[9]   Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films [J].
Besson, S ;
Gacoin, T ;
Jacquiod, C ;
Ricolleau, C ;
Babonneau, D ;
Boilot, JP .
JOURNAL OF MATERIALS CHEMISTRY, 2000, 10 (06) :1331-1336
[10]   A COMPUTATIONAL EXAMINATION OF ORTHOGONAL DISTANCE REGRESSION [J].
BOGGS, PT ;
SPIEGELMAN, CH ;
DONALDSON, JR ;
SCHNABEL, RB .
JOURNAL OF ECONOMETRICS, 1988, 38 (1-2) :169-201