NV-SRAM: A nonvolatile SRAM with backup ferroelectric capacitors

被引:49
作者
Miwa, T [1 ]
Yamada, J [1 ]
Koike, H [1 ]
Toyoshima, H [1 ]
Amanuma, K [1 ]
Kobayashi, S [1 ]
Tatsumi, T [1 ]
Maejima, Y [1 ]
Hada, H [1 ]
Kunio, T [1 ]
机构
[1] NEC Corp Ltd, Syst Devices & Fundamental Res, Kanagawa 2291198, Japan
关键词
embedded memory; ferroelectric memory; SRAM;
D O I
10.1109/4.910492
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper demonstrates new circuit technologies that enable a 0.25-mum ASIC SRAM macro to be nonvolatile with only a 17% cell-area overhead. New capacitor-on-metal/via-stacked-plug process technologies permit a nonvolatile SRAM (NV-SRAM) cell to consist of a six-transistor ASIC SRAM cell and two backup ferroelectric capacitors stacked over the SRAM portion. READ and WRITE operations in this NV-SRAM cell are very similar to those of a standard SRAM, and this NV-SRAM shares almost all the circuit properties of a standard SRAM. Because each memory cell can perform STORE and RECALL individually, both can execute massive-parallel operations. A V-dd/2 plate-line architecture makes READ/WRITE fatigue negligible. A 512-byte test chip was successfully fabricated to show compatibility with ASIC technologies.
引用
收藏
页码:522 / 527
页数:6
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