Low temperature metal-organic chemical vapor deposition of (Ba,Sr)TiO3 thin films for capacitor applications

被引:3
作者
Hwang, CS
Park, J
Yang, DY
Yang, CH
Kim, DH
Han, YK
Oh, K
Hwang, CJ
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Jusung Engn, Kwangju Kun 464890, Kyunggi Do, South Korea
关键词
low temperature MOCVD; BST; dome type reactor; uniformity of composition and thickness;
D O I
10.1080/10584580008222251
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low temperature metal-organic chemical vapor deposition (MOCVD) processes for producing high dielectric (Ba,Sr)TiO3 (BST) films studied using a noble dome type reactor, liquid delivery technique and new precursors. One of the problems associated with conventional MOCVD reactors having a shower head was substrate surface-dependent deposition of film composition as well as the thickness. which might result in pattern-dependent deposition of BST films. The new chamber used in this study was capable of controlling both the substrate heater and chamber wall temperatures which successfully eliminated such surface-dependent deposition property. The film composition and thickness were essentially the same on either Pt and SiO2 surfaces when both the wall and heater temperatures were controlled. However, the film composition, thickness and uniformity were differed markedly on the Pt and SiO2 surfaces when only the heater temperature was controlled. Excellent step coverage and smooth (haze-free) surface morpholgy of BST films were obtained from a deposition at 470 degreesC.
引用
收藏
页码:37 / 44
页数:8
相关论文
共 6 条
[1]   DEPOSITION OF EXTREMELY THIN (BA,SR)TIO3 THIN-FILMS FOR ULTRA-LARGE-SCALE INTEGRATED DYNAMIC RANDOM-ACCESS MEMORY APPLICATION [J].
HWANG, CS ;
PARK, SO ;
CHO, HJ ;
KANG, CS ;
KANG, HK ;
LEE, SI ;
LEE, MY .
APPLIED PHYSICS LETTERS, 1995, 67 (19) :2819-2821
[2]   Effects of post-annealing on the conduction properties of Pt/(Ba,Sr)TiO3/Pt capacitors for dynamic random access memory applications [J].
Joo, JH ;
Jeon, YC ;
Seon, JM ;
Oh, KY ;
Roh, JS ;
Kim, JJ .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (7A) :4382-4385
[3]   Preparation and electrical properties of SrTiO3 thin films deposited by liquid source metal-organic chemical vapor deposition (MOCVD) [J].
Kang, CS ;
Hwang, CS ;
Cho, HJ ;
Lee, BT ;
Park, SO ;
Kim, JW ;
Horii, H ;
Lee, SI ;
Koh, YB ;
Lee, MY .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (9B) :4890-4895
[4]   Technology challenges and solutions for 1Gbit and beyond [J].
Mazure, C ;
Alsmeier, J ;
Dehm, C ;
Honlein, W .
INTEGRATED FERROELECTRICS, 1998, 21 (1-4) :15-25
[5]   Future directions for DRAM memory cell technology [J].
Nitayama, A ;
Kohyama, Y ;
Hieda, K .
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, 1998, :355-358
[6]  
Yuuki A, 1995, INTERNATIONAL ELECTRON DEVICES MEETING, 1995 - IEDM TECHNICAL DIGEST, P115, DOI 10.1109/IEDM.1995.497195