Unconventional Face-On Texture and Exceptional In-Plane Order of a High Mobility n-Type Polymer

被引：354

作者：

Rivnay, Jonathan ^{[1
]}

Toney, Michael F. ^{[2
]}

Zheng, Yan ^{[4
]}

Kauvar, Isaac V. ^{[1
]}

Chen, Zhihua ^{[4
]}

Wagner, Veit ^{[3
]}

Facchetti, Antonio ^{[4
]}

Salleo, Alberto ^{[1
]}

机构：

[1] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA

[2] Stanford Synchrotron Radiat Lightsource, Menlo Pk, CA 94025 USA

[3] Jacobs Univ Bremen, D-28759 Bremen, Germany

[4] Polyera Corp, Skokie, IL 60077 USA

来源：

ADVANCED MATERIALS | 2010年 / 22卷 / 39期

基金：

美国国家科学基金会;

关键词：

FIELD-EFFECT MOBILITY; CHARGE-TRANSPORT; REGIOREGULAR POLYTHIOPHENE; HOLE MOBILITY; THIN-FILMS; ORIENTATION; INTERFACE;

D O I：

10.1002/adma.201001202

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Substantial in-plane crystallinity and dominant face-on stacking are observed in thin films of a high-mobility n-type rylene-thiophene copolymer. Spun films of the polymer, previously thought to have little or no order are found to exhibit an ordered microstructure at both interfaces, and in the bulk. The implications of this type of packing and crystalline morphology are discussed as they relate to thin-film transistors.

引用

页码：4359 / +

页数：6

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