Multilayer structural determination of the GaAs((1)over-bar(1)over-bar(1)over-bar)2x2 reconstruction by automated tensor LEED

被引：6

作者：

Deng, BC ^{[1
]}

Yu, ZX

Xu, G

Mrstik, BJ

Tong, SY

机构：

[1] Zhongshan Univ, Guangzhou Univ, Dept Phys, Guangzhou 510275, Peoples R China

[2] USN, Res Lab, Washington, DC 20375 USA

[3] Univ Hong Kong, Dept Phys, Hong Kong, Peoples R China

来源：

PHYSICAL REVIEW B | 1999年 / 59卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.59.9775

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The multilayer atomic coordinates for the GaAs((1) over bar (1) over bar (1) over bar)(2 x2) surface have been determined using automated tensor low-energy electron diffraction. The results confirm the As adatom trimer model found by total-energy calculations and scanning tunneling microscopy studies although details of the displacements are different. The low-energy electron diffraction analysis, being sensitive to multilayer spacings in the surface region, shows that substantial subsurface relaxations are present. [S0163-1829(99)15115-4].

引用

页码：9775 / 9778

页数：4

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