Angle-dependent THz tomography - characterization of thin ceramic oxide films for fuel cell applications

A time-resolved THz tomography system for the incidence-angle-dependent three-dimensional characterization of layered structures is presented. The capabilities of the developed system are demonstrated on multi-layer ceramic samples used for solid oxide fuel cells (SOFC). Appropriate methods for determining unknown refractive indices are discussed. It is shown how the angle of incidence of a THz imaging system has a significant influence on measured signals. This fact can be exploited especially in Brewster-angle configurations to enhance the capabilities of any THz tomography system. Data evaluation algorithms are presented.