THz near-field imaging

被引：312

作者：

Hunsche, S

Koch, M

Brener, I

Nuss, MC

机构：

[1] AT&T Bell Labs, Lucent Technol, Holmdel, NJ 07733 USA

[2] Univ Munchen, Sekt Phys, D-80799 Munchen, Germany

[3] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

来源：

OPTICS COMMUNICATIONS | 1998年 / 150卷 / 1-6期

关键词：

THz imaging; far-infrared microscopy; near-field microscopy; ultrafast technology;

D O I：

10.1016/S0030-4018(98)00044-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present first results of near-field imaging with ultrashort, broadband far-infrared pulses. By focusing the radiation into a tapered metal tip with a small er;it aperture and scanning a sample in the near field of this aperture, sub-wavelength spatial resolution better than lambda/4 is demonstrated. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

引用

页码：22 / 26

页数：5

共 17 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].