Highly luminescent columnar ZnO films grown directly on n-Si and p-Si substrates by low-temperature electrochemical deposition

被引:24
作者
Lupan, Oleg [2 ]
Pauporte, Thierry [2 ]
Ursaki, V. V. [1 ]
Tiginyanu, I. M. [1 ]
机构
[1] Moldavian Acad Sci, Inst Appl Phys, Inst Elect Engn & Nanotechnol, MD-2028 Kishinev, Moldova
[2] Chim ParisTech, CNRS, LECIME, UMR 7575, F-75231 Paris 05, France
关键词
ZnO; Thin films; Electrodeposition; Photoluminescence; Annealing; RESONANT RAMAN-SCATTERING; ZINC-OXIDE; HYDROGEN-PEROXIDE; EPITAXIAL ELECTRODEPOSITION; NANOWIRE ARRAYS; SILICON; PHOTOLUMINESCENCE; GAN;
D O I
10.1016/j.optmat.2011.01.024
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, nanocolumnar zinc oxide thin films were catalyst-free electrodeposited directly on n-Si and p-Si substrates, what makes an important junction for optoelectronic devices. We demonstrate that ZnO thin films can be grown on Si at low cathodic potential by electrochemical synthesis. The scanning electron microscopy SEM showed that the ZnO thin films consist of nanocolumns with radius of about 150 nm on n-Si and 200 nm on p-Si substrates, possess uniform size distribution and fully covers surfaces. X-ray diffraction (XRD) measurements show that the films are crystalline material and are preferably grown along (0 0 2) direction. The impact of thermal annealing in the temperature range of 150-800 degrees C on ZnO film properties has been carried out. Low-temperature photoluminescence (PL) spectra of the as-prepared ZnO/Si samples show the extremely high intensity of the near bandgap luminescence along with the absence of visible emission. The optical quality of ZnO thin films was improved after postdeposition thermal treatment at 150 degrees C and 400 degrees C in our experiments, however, the luminescence intensity was found to decrease at higher annealing temperatures (800 degrees C). The obtained results indicate that electrodeposition is an efficient low-temperature technique for the growth of high-quality and crystallographically oriented ZnO thin films on n-Si and p-Si substrates for device applications. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:914 / 919
页数:6
相关论文
共 46 条
[1]  
[Anonymous], APPL SURF SCI
[2]  
Brown H. E., 1960, J PHYS CHEM SOLIDS, V15, P86
[3]  
Brown H.E., 1957, ZINC OXIDE REDISCOVE
[4]  
Brown H.E., 1976, ZINC OXIDE PROPERTIE
[5]   Enhanced radiation hardness of ZnO nanorods versus bulk layers [J].
Burlacu, A. ;
Ursaki, V. V. ;
Lincot, D. ;
Skuratov, V. A. ;
Pauporte, T. ;
Rusu, E. ;
Tiginyanu, I. M. .
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2008, 2 (02) :68-70
[6]   The impact of morphology upon the radiation hardness of ZnO layers [J].
Burlacu, A. ;
Ursaki, V. V. ;
Skuratov, V. A. ;
Lincot, D. ;
Pauporte, T. ;
Elbelghiti, H. ;
Rusu, E. V. ;
Tiginyanu, I. M. .
NANOTECHNOLOGY, 2008, 19 (21)
[7]  
Flitsiyan E, 2009, MATER RES SOC SYMP P, V1108, P55
[8]   Oxygen reduction reaction on electrodeposited zinc oxide electrodes in KC1 solution at 70°C [J].
Goux, A ;
Pauporté, T ;
Lincot, D .
ELECTROCHIMICA ACTA, 2006, 51 (15) :3168-3172
[9]   Temperature effects on ZnO electrodeposition [J].
Goux, A ;
Pauporté, T ;
Chivot, J ;
Lincot, D .
ELECTROCHIMICA ACTA, 2005, 50 (11) :2239-2248