Method for analyzing series resistance and diode quality factors from field data of photovoltaic modules

被引：14

作者：

del Cueto, JA ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 1998年 / 55卷 / 03期

关键词：

photovoltaic module; series resistance; diode quality factor;

D O I：

10.1016/S0927-0248(98)00123-8

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

A procedure is detailed in which the effects of series resistance and diode quality factors are separately analyzed and quantified using current-voltage (IV) data gathered in situ from three photovoltaic (PV) modules. Series resistance losses are implicated to be largely responsible for reduction in the fill factor values for intensities of 60% of one sun or greater. The data presented are from one cadmium telluride (CdTe) and two amorphous silicon (a-Si) modules and were taken in held deployment with a data acquisition system. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

引用

页码：291 / 297

页数：7

共 7 条

[1]

Bevington R., 1969, DATA REDUCTION ERROR

[2] FORWARD IV PLOT FOR NONIDEAL SCHOTTKY DIODES WITH HIGH SERIES RESISTANCE [J].