Overcoming limitations in semiconductor alloy design

被引:30
作者
Mascarenhas, A [1 ]
Zhang, Y [1 ]
Verley, J [1 ]
Seong, MJ [1 ]
机构
[1] Natl Renewable Energy Lab, Golden, CO 80401 USA
关键词
isoelectronic impurity; co-doping; GaAs : N : Bi; GaP : N : Bi;
D O I
10.1006/spmi.2001.0984
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The phenomenon of giant band gap 'bowing' recently observed in several III-V dilute nitride alloys is promising for increasing the flexibility in choice of semiconductor band gaps available for specified lattice constants. However, the poor electrical transport properties that these materials exhibit seriously limit their usefulness. It is proposed that these materials behave as heavily nitrogen-doped semiconductors rather than dilute nitride alloys and that the abnormal or irregular alloy behavior is associated with impurity band formation that manifests itself in the giant bowing and poor transport properties. The potential for regularizing the alloy behavior using isoelectronic co-doping is discussed. (C) 2001 Academic Press.
引用
收藏
页码:395 / 404
页数:10
相关论文
共 43 条
[1]  
ATEN AC, 1965, PHILIPS RES REP, V20, P395
[2]   LUMINESCENCE QUENCHING AND THE FORMATION OF THE GAP1-XNX ALLOY IN GAP WITH INCREASING NITROGEN-CONTENT [J].
BAILLARGEON, JN ;
CHENG, KY ;
HOFLER, GE ;
PEARAH, PJ ;
HSIEH, KC .
APPLIED PHYSICS LETTERS, 1992, 60 (20) :2540-2542
[3]  
BAZHENOV VK, 1984, SOV PHYS SEMICOND+, V18, P843
[4]   Nitrogen-induced levels in GaAs1-xNx studied with resonant Raman scattering [J].
Cheong, HM ;
Zhang, Y ;
Mascarenhas, A ;
Geisz, JF .
PHYSICAL REVIEW B, 2000, 61 (20) :13687-13690
[5]  
Faulkner R., 1970, J LUMIN, V1, P552
[6]   TOWARD A THEORY OF ISOELECTRONIC IMPURITIES IN SEMICONDUCTORS [J].
FAULKNER, RA .
PHYSICAL REVIEW, 1968, 175 (03) :991-&
[7]   The ideal light source for datanets [J].
Giboney, KS ;
Aronson, LB ;
Lemoff, BE .
IEEE SPECTRUM, 1998, 35 (02) :43-+
[8]  
Grüning H, 1999, PHYS STATUS SOLIDI B, V215, P39, DOI 10.1002/(SICI)1521-3951(199909)215:1<39::AID-PSSB39>3.0.CO
[9]  
2-B
[10]  
JOSEPH M, 1999, JPN J APPL PHYS, V38, P1205