Para-sexiphenyl thin films on KCl(100) surfaces: Growth morphologies and their individual epitaxial order

被引:33
作者
Haber, T
Andreev, A
Thierry, A
Sitter, H
Oehzelt, M
Resel, R
机构
[1] Graz Univ Technol, Inst Solid State Phys, A-8010 Graz, Austria
[2] Univ Linz, Inst Solid State Phys & Semicond, A-4040 Linz, Austria
[3] CNRS, ULP, Inst Charles Sadron, Strasbourg, France
基金
奥地利科学基金会;
关键词
crystal morphology; crystal structure; X-ray diffraction; hot wall epitaxy; aromatic compounds;
D O I
10.1016/j.jcrysgro.2005.06.026
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
This work focuses on structural and morphological studies of para-sexiphenyl thin films grown on freshly cleaved KC1(1 0 0) surfaces. Atomic force microscopy images show different morphologies, namely terrace like growth and different kinds of needle like growths. By X-ray diffraction methods different crystal alignments of the organic film on the substrate are found. The different crystal alignments are assigned to the observed morphologies by transmission electron microscopy and diffraction. Regarding the incommensurate interfaces (on the part of the surface unit cells) it is concluded that the epitaxy is dominated by an alignment of small crystallites on the KCI(1 0 0) surface. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:209 / 220
页数:12
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