Analysis of the measured signals in apertureless near-field optical microscopy

被引:16
作者
Formanek, F [1 ]
De Wilde, Y [1 ]
Aigouy, L [1 ]
机构
[1] Ecole Super Phys & Chim Ind Ville Paris, CNRS, UPR A0005, Lab Opt Phys, F-75005 Paris, France
关键词
near-field scanning microscopy; imaging and optical processing;
D O I
10.1016/j.ultramic.2004.11.004
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present an analytical model able to explain the optical signal recorded during our experimental approach curves in the infrared at a wavelength gimel = 10.6 mu m, with a home-made apertureless near-field scanning optical microscope ANSOM. This model uses classical electrodynamics to calculate the scattering cross section of the oscillating tip, considered as a dipole, and its dielectric image in the sample as a function of the tip-sample separation from the near-field to the far-field regime. The dipoles are placed in a non-uniform electric field because of the standing wave arising from the interference between the incident and the specular laser beams. We also added a background field coming from a scatterer on the surface in order to account for zeroing of the optical signal for particular tip-sample separation and interference patterns. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:133 / 139
页数:7
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