Anatomy an in-flight anomaly: Investigation of proton-induced SEE test results for stacked IBM DRAMs

被引：26

作者：

LaBel, KA ^{[1
]}

Marshall, PW

Barth, JL

Katz, RB

Reed, RA

Leidecker, HW

Kim, HS

Marshall, CJ

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] Jackson & Tull Chartered Engineers, Lanham, MD 20706 USA

[3] NRL, Washington, DC 20375 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 06期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1109/23.736545

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules.

引用

页码：2898 / 2903

页数：6

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