Comparison of density difference measurements at PTB and NMIJ

被引:4
作者
Bettin, H [1 ]
Toth, H
Waseda, A
Fujii, K
机构
[1] PTB, D-38116 Braunschweig, Germany
[2] NMIJ, Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058563, Japan
关键词
Avogadro constant; density; flotation; pressure of flotation; silicon (single) crystals;
D O I
10.1109/TIM.2005.843525
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon single crystals are used as density standards and to determine the Avogadro constant. Density comparisons by the flotation method can check the homogeneity of the silicon crystals and determine the absolute density of silicon samples by comparison to primary density standards. Results of the two flotation apparatuses at NMIJ (Japan) and PTB (Germany) were compared with each other and with density determinations from other methods. For this purpose, three small silicon samples from the crystals WASO 04 and NRLM4 were measured in both institutes. These measurements show that the flotation method is able to detect and measure density differences with uncertainties of 0.02 (.) 10(-6) rho. Additionally, the density of the 1-kg silicon sphere AVO#1 was determined by flotation comparisons to primary standards of the institutes and compared with density values obtained by different methods. With one exception, all results are consistent within the combined uncertainties, the largest relative density difference being only 0.18 (.) 10(-6).
引用
收藏
页码:877 / 881
页数:5
相关论文
共 6 条
[1]   Determination of the Avogadro constant via the silicon route [J].
Becker, P ;
Bettin, H ;
Danzebrink, HU ;
Gläser, M ;
Kuetgens, U ;
Nicolaus, A ;
Schiel, D ;
De Bièvre, P ;
Valkiers, S ;
Taylor, P .
METROLOGIA, 2003, 40 (05) :271-287
[2]   Density comparisons of silicon samples by the pressure-of-flotation method at PTB [J].
Bettin, H ;
Toth, H .
METROLOGIA, 2004, 41 (02) :S52-S61
[3]   Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant [J].
Fujii, K ;
Waseda, A ;
Kuramoto, N ;
Mizushima, S ;
Tanaka, M ;
Valkiers, S ;
Taylor, P ;
Kessel, R ;
De Bièvre, P .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (02) :646-651
[4]   DETERMINATION OF DIFFERENCES IN THE DENSITY OF SILICON SINGLE-CRYSTALS BY OBSERVING THEIR FLOTATION AT DIFFERENT PRESSURES [J].
KOZDON, AF ;
SPIEWECK, F .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (03) :420-426
[5]   Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ [J].
Waseda, A ;
Fujii, K .
METROLOGIA, 2004, 41 (02) :S62-S67
[6]   High precision density comparison measurement of silicon crystals by the pressure of flotation method [J].
Waseda, A ;
Fujii, K .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (12) :2039-2045