Non-contact feedback for scanning capillary microscopy

被引:11
作者
Eng, L
Wirth, E
Suter, T
Bohni, H
机构
[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
[2] ETH Zurich, Inst Mat Chem & Corros, CH-8093 Zurich, Switzerland
关键词
scanning capillary microscopy; non contact; probe microscopy; electrochemistry;
D O I
10.1016/S0013-4686(98)00043-7
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
We demonstrate the development of a dynamic probing mode for scanning capillary microscopy. Tip-sample distance variations are induced by sinusoidally activating resonances of a vibrating membrane to which the sample is mounted. A piezoelectric transducer glued to the back-side of the steel membrane allows a fully electronic feedback to be set-up. Both bare capillary tubes and micropipettes previously coated with a silicone lacquer were found to reproducibly approach to the sample surface when measuring the interaction force as a function of tip-sample distance. Nevertheless, significant differences are found depending whether the capillary was filled or not. In these spectra, the onset of interaction manifests in both a significant reduction of vibration amplitude as well as a pronounced phase shift with respect to the free membrane oscillation. Time stable feedback operation regulating on a constant interaction gradient is presented. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:3029 / 3033
页数:5
相关论文
共 9 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]  
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[3]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689
[4]  
BOHNI H, 1995, ELECTROCHIM ACTA, V40, P10
[5]   THE SCANNING ION-CONDUCTANCE MICROSCOPE [J].
HANSMA, PK ;
DRAKE, B ;
MARTI, O ;
GOULD, SAC ;
PRATER, CB .
SCIENCE, 1989, 243 (4891) :641-643
[6]   SCANNING ION-CONDUCTANCE MICROSCOPE AND ATOMIC FORCE MICROSCOPE [J].
PRATER, CB ;
DRAKE, B ;
GOULD, SAC ;
HANSMA, HG ;
HANSMA, PK .
SCANNING, 1990, 12 (01) :50-52
[7]   In situ scanning tunneling microscope investigation of passivation and stainless steels and iron [J].
Schreyer, A ;
Eng, L ;
Bohni, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1162-1166
[8]  
SCHREYER A, 1997, SERIES MONOGRAPHS CH
[9]  
SUTER T, 1996, ELECTROCHEM SOC P, V95, P12