Real and apparent grain sizes in chemical vapor deposited diamond

被引:11
作者
Charles, SJ
Steeds, JW
Evans, DJF
Butler, JE
机构
[1] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England
[2] DTC Res Ctr, Maidenhead SL6 6XW, Berks, England
[3] USN, Res Lab, Washington, DC 20375 USA
关键词
grain boundaries; surfaces; microstructure; characterization methods; boron-doped diamond; grain size;
D O I
10.1016/S0167-577X(03)00152-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A boron-doped, chemical vapor deposited (CVD) diamond, with a doping level of approximately 10(18) cm(-3), is used to demonstrate the very different grain sizes deduced from the application of various scanning electron microscopy (SEM) techniques to a polished polycrystalline surface. The boron-doped sample was chosen for this investigation because of the very different boron up-take on the {111} and {100} growth sectors and the consequent changes on the physical properties of the underlying crystal. It is shown that SEM contrast resulting from electron channeling gives a gross over-estimate of the grain size, while luminescence microscopy and surface enhanced secondary emission give a better indication, although they can give slight underestimates. The results are consistent with recently published transmission electron microscopy (TEM) observations which show that the grains in thick polycrystalline CVD diamond form clusters with common growth directions [Philos. Mag., A 82 (2002) 1741]. The individual grains within a cluster are related by various twinning operations. This behavior is characteristic of columnar CVD growth and does not depend on boron doping. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:3690 / 3693
页数:4
相关论文
共 15 条
[1]   EVIDENCE OF DONOR-ACCEPTOR PAIR RECOMBINATION FROM A NEW EMISSION BAND IN SEMICONDUCTING DIAMOND [J].
FREITAS, JA ;
KLEIN, PB ;
COLLINS, AT .
APPLIED PHYSICS LETTERS, 1994, 64 (16) :2136-2138
[2]   Secondary electron emission measurements on synthetic diamond films [J].
Hopman, HJ ;
Verhoeven, J ;
Bachmann, PK ;
Wilson, H ;
Kroon, R .
DIAMOND AND RELATED MATERIALS, 1999, 8 (06) :1033-1038
[3]   DESEGREGATION OF BORON AT THE GRAIN-BOUNDARIES OF THE IN-SITU BORON-DOPED DIAMOND FILMS [J].
HUANG, JT ;
HU, GS ;
HWANG, J ;
CHANG, H ;
LEE, LJ .
APPLIED PHYSICS LETTERS, 1995, 67 (16) :2382-2384
[4]   EXCITONIC RECOMBINATION RADIATION IN UNDOPED AND BORON-DOPED CHEMICAL-VAPOR-DEPOSITED DIAMONDS [J].
KAWARADA, H ;
MATSUYAMA, H ;
YOKOTA, Y ;
SOGI, T ;
YAMAGUCHI, A ;
HIRAKI, A .
PHYSICAL REVIEW B, 1993, 47 (07) :3633-3637
[5]   Origin of surface conductivity in diamond [J].
Maier, F ;
Riedel, M ;
Mantel, B ;
Ristein, J ;
Ley, L .
PHYSICAL REVIEW LETTERS, 2000, 85 (16) :3472-3475
[6]  
Malta DP, 1996, MATER RES SOC SYMP P, V416, P311
[7]   Effects of dopant concentration, crystallographic orientation, and crystal morphology on secondary electron emission from diamond [J].
Miller, JB ;
Brandes, GR .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (09) :4538-4545
[8]   Surface doping: a special feature of diamond [J].
Ristein, J ;
Riedel, M ;
Maier, F ;
Mantel, BF ;
Stammler, M ;
Ley, L .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (40) :8979-8987
[9]   Characterisation and lattice location of nitrogen and boron in homoepitaxial CVD diamond [J].
Samlenski, R ;
Haug, C ;
Brenn, R ;
Wild, C ;
Locher, R ;
Koidl, P .
DIAMOND AND RELATED MATERIALS, 1996, 5 (09) :947-951
[10]   Secondary electron emission from diamond surfaces [J].
Shih, A ;
Yater, J ;
Pehrsson, P ;
Butler, J ;
Hor, C ;
Abrams, R .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (04) :1860-1867