Phase-sensitive time-domain terahertz reflection spectroscopy

被引：88

作者：

Pashkin, A

Kempa, M

Nemec, H

Kadlec, F

Kuzel, P

机构：

[1] Acad Sci Czech Republ, Inst Phys, Prague 18221 8, Czech Republic

[2] Acad Sci Czech Republ, Ctr Complex Mol Syst & Biomol, Prague 18221 8, Czech Republic

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 11期

关键词：

D O I：

10.1063/1.1614878

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An approach to time-domain terahertz reflection spectroscopy is proposed and demonstrated. It allows one to obtain very accurately the relative phase of a reflected THz wave form, and consequently the complex dielectric function can be precisely extracted. The relevant setup was demonstrated to allow measurements of a variety of samples: we present results for doped silicon and for ferroelectric SrBi2Ta2O9 (bulk ceramics as well as thin film on sapphire substrates). (C) 2003 American Institute of Physics.

引用

收藏

页码：4711 / 4717

页数：7

相关论文

共 14 条

[1] INFRARED ABSORPTION AT LONGITUDINAL OPTIC FREQUENCY IN CUBIC CRYSTAL FILMS [J].

BERREMAN, DW .

PHYSICAL REVIEW, 1963, 130 (06) :2193-&

[2] A reliable method for extraction of material parameters in terahertz time-domain spectroscopy [J].

Duvillaret, L ;

Garet, F ;

Coutaz, JL .

IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1996, 2 (03) :739-746

[3]

Gruner G., 1998, Millimeter and Submillimeter Wave Spectroscopy of Solids

[4] Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy [J].

Hashimshony, D ;

Geltner, I ;

Cohen, G ;

Avitzour, Y ;

Zigler, A ;

Smith, C .

JOURNAL OF APPLIED PHYSICS, 2001, 90 (11) :5778-5781

[5] Transient terahertz reflection spectroscopy of undoped InSb from 0.1 to 1.1 THz [J].

Howells, SC ;

Schlie, LA .

APPLIED PHYSICS LETTERS, 1996, 69 (04) :550-552

[6] Characterization of optically dense, doped semiconductors by reflection THz time domain spectroscopy [J].

Jeon, TI ;

Grischkowsky, D .

APPLIED PHYSICS LETTERS, 1998, 72 (23) :3032-3034

[7] Ferroelastic phase in SrBi2Ta2O9 and study of the ferroelectric phase-transition dynamics [J].

Kamba, S ;

Pokorny, J ;

Porokhonskyy, V ;

Petzelt, J ;

Moret, MP ;

Garg, A ;

Barber, ZH ;

Zallen, R .

APPLIED PHYSICS LETTERS, 2002, 81 (06) :1056-1058

[8] Convertible transmission-reflection time-domain terahertz spectrometer [J].

Khazan, M ;

Meissner, R ;

Wilke, I .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (08) :3427-3430

[9] Time-domain dielectric constant measurement of thin film in GHz-THz frequency range near the Brewster angle [J].

Li, M ;

Cho, GC ;

Lu, TM ;

Zhang, XC ;

Wang, SQ ;

Kennedy, JT .

APPLIED PHYSICS LETTERS, 1999, 74 (15) :2113-2115

[10] Measurement of complex optical constants of a highly doped Si wafer using terahertz ellipsometry [J].

Nagashima, T ;

Hangyo, M .

APPLIED PHYSICS LETTERS, 2001, 79 (24) :3917-3919