Enhanced resolution in subsurface near-field optical microscopy

被引：72

作者：

Krutokhvostov, Roman ^{[1
]}

Govyadinov, Alexander A. ^{[1
]}

Stiegler, Johannes M. ^{[1
]}

Huth, Florian ^{[1
,2
]}

Chuvilin, Andrey ^{[1
,3
]}

Carney, P. Scott ^{[1
,4
,5
]}

Hillenbrand, Rainer ^{[1
,3
]}

机构：

[1] CIC NanoGUNE Consolider, E-20018 Donostia San Sebastian, Spain

[2] Neaspec GmbH, D-82152 Martinsried, Germany

[3] Basque Fdn Sci, IKERBASQUE, E-48011 Bilbao, Spain

[4] Univ Illinois, ECE Dept, Urbana, IL 61801 USA

[5] Univ Illinois, Beckman Inst, Urbana, IL 61801 USA

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 01期

关键词：

SCATTERING; CONTRAST; LIGHT; NANOPARTICLES; SPECTROSCOPY; ABSORPTION;

D O I：

10.1364/OE.20.000593

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report an experimental analysis of the capabilities of scattering-type scanning near-field optical microscopy for mapping subsurface features at varying depths. For the first time, we demonstrate experimentally that both the spatial resolution and depth contrast can be improved in subsurface microscopy by demodulating the measured near-field signal at higher harmonics of the probe's tapping frequency and by operating at smaller tapping amplitudes. Our findings are qualitatively supported by a simple dipole model. (C) 2011 Optical Society of America

引用

页码：593 / 600

页数：8

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