Electron conditioning of technical aluminium surfaces: Effect on the secondary electron yield

被引:23
作者
Le Pimpec, F [1 ]
Kirby, RE [1 ]
King, FK [1 ]
Pivi, M [1 ]
机构
[1] Stanford Linear Accelerator Ctr, Menlo Pk, CA 94025 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2005年 / 23卷 / 06期
关键词
D O I
10.1116/1.2049306
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effect of electron conditioning on commercially available aluminium alloys 1100 and 6063 was investigated. Contrary to the assumption that electron conditioning, if performed long enough, can reduce and stabilize the secondary electron yield (SEY) to low values (<= 1.3, the value for many pure elements), the SEY of aluminium did not go lower than 1.8. In fact, it reincreased with continued electron exposure dose. The SEY was monitored as a function of electron dose and the surface chemistry was measured with x-ray photoelectron spectroscopy (XPS). The XPS carbon and aluminium core levels showed that the late increase in SEY is due to electron desorption of adsorbed gas, thereby exposing high-SEY Al2O3.(c) (c) 2005 American Vacuum Society.
引用
收藏
页码:1610 / 1618
页数:9
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