High frequency write head measurement with the phase detection magnetic force microscope

被引:20
作者
Abe, M [1 ]
Tanaka, Y [1 ]
机构
[1] Toshiba Corp, Data Storage Dev Ctr, Tokyo 1988710, Japan
关键词
D O I
10.1063/1.1359232
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrated the measurement of the high frequency (HF) magnetic field of a write head with the phase detection magnetic force microscope. An amplitude-modulated current was applied to the head coil to detect the force gradient induced by the HF magnetic field. Spatial resolution of this method was higher than that of the deflection detection method previously proposed. By the phase detection method, dynamic HF magnetic fields at the poles of the write heads were clearly imaged. HF magnetic field leakage was observed along the P2 pole shape on the air-bearing surface. The frequency dependence of the write head dynamics up to 350 MHz was also investigated. (C) 2001 American Institute of Physics.
引用
收藏
页码:6766 / 6768
页数:3
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