The structures of inversion domain boundaries in AlN ceramics

被引:11
作者
Yan, YF
Terauchi, M
Tanaka, M
机构
[1] Research Institute for Scientific Measurements, Tohoku University, Sendai
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1997年 / 75卷 / 04期
基金
日本学术振兴会;
关键词
D O I
10.1080/01418619708214007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The structures of inversion domain boundaries in sintered AlN ceramics were studied by convergent-beam electron diffraction and high-resolution electron microscopy. The displacement vectors at a flat and a curved inversion domain boundary were determined to be R(F) = (0.11 +/- 0.02)[0001] + epsilon(F), where epsilon(F) = (0.02 +/- 0.05)[1 (1) over bar 00] and R(c) = (0.17 +/- 0.02)[0001] + epsilon(c) where epsilon(c) = (0.03 +/- 0.01)[(1) over bar 100] respectively. An interfacial model was derived for the flat inversion domain boundary. The model contains a single Al-O(N) octahedron layer at the interface and has a stacking sequence of ... cAaC-cAb-BaAb ..., where -cAb- indicates the single Al-O(N) octahedron layer. A high-resolution electron microscopy study supported the present model.
引用
收藏
页码:1005 / 1022
页数:18
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