Preparation of highly (100)-oriented LaNiO3 nanocrystalline films by metalorganic chemical liquid deposition

被引:39
作者
Wang, GS
Zhao, Q
Meng, XJ
Chu, JH
Rémiens, D
机构
[1] CNRS, UMR 8520, MIMM Team, DOAE,IEMN, F-59650 Villeneuve Dascq, France
[2] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
基金
中国国家自然科学基金;
关键词
x-ray diffraction; perovskite; oxide superconducting materials;
D O I
10.1016/j.jcrysgro.2005.01.099
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Lanthanum nickelate LaNiO3 (LNO) nanocrystalline films have been grown by the metalorganic chemical liquid deposition (MOCLD) technique using lanthanum acetate and nickel acetate as the starting materials. The technique simplified the process of preparation for LNO thin films by chemical solution routes. XRD measurements showed that the LNO films deposited on Si, SiO2/Si and Pt/Ti/SiO2/Si substrates exhibit preferential (10 0) orientation. The effects of pyrolysis temperature and thickness on (100)-orientation parameters of LNO films were investigated. The lowest resistivity film was obtained by annealing at 750 degrees C. The effects of thickness and annealing temperature on resistivity of the LNO films have been discussed. PbZr0.4Ti0.6O3 (PZT) films deposited onto LNO films displayed a good P-E hysteresis characteristic and fatigue free to 10(8) fatigue cycles. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:450 / 456
页数:7
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