Field - And photoassisted field emission studies of calcium fluoride coated silicon tips

被引：7

作者：

Konopsky, VN

Zhirnov, VV

Sokolov, NS

Alvarez, JC

Givargizov, EI

Bormatova, LV

Letokhov, VS

Sekatskii, SK

机构：

[1] AV SHUBNIKOV CRYSTALLOG INST,MOSCOW 117333,RUSSIA

[2] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA

来源：

JOURNAL DE PHYSIQUE IV | 1996年 / 6卷 / C5期

关键词：

D O I：

10.1051/jp4:1996521

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Measurements of field emission current-voltage and Fowler-Nordheim characteristics of Si tips covered by 100 nm-thick CaF2 epitaxial layers have been for the first time performed. It was found that in spite of dielectric nature of the coating, the tips demonstrate high emissivity comparable with the diamond coated tips. Results of high resolution photoassisted field emission investigations of CaF2/Si structures are presented.

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页码：129 / 134

页数：6

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