Piezoelectric photothermal investigation of proton irradiation induced defects in CuInSe2 epitaxial films

被引:5
作者
Akaki, Y
Ohryoji, N
Fukuyama, A
Yoshino, K
Kawakita, S
Imaizumi, M
Niki, S
Sakurai, K
Ishizuka, S
Ohshima, T
Ikari, T
机构
[1] Miyagi Natl Coll Technol, Dept Elect Engn, Miyazaki 8858567, Japan
[2] Miyazaki Univ, Dept Elect & Elect Engn, Miyazaki 8892192, Japan
[3] Miyazaki Univ, Dept Appl Phys, Miyazaki 8892192, Japan
[4] NASDA Tsukuba Space Ctr, Off Res & Dev, Ibaraki 3058505, Japan
[5] Natl Inst AIST, Photon Res Inst, Tsukuba, Ibaraki 3058568, Japan
[6] Japan Atom Energy Res Inst, Takasaki, Gumma 3701292, Japan
关键词
piezoelectric photothermal investigation; proton irradiation; CuInSe2;
D O I
10.1016/j.tsf.2004.11.028
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Proton irradiation damage for CuInSe2 (CIS) solar cell material was investigated by using a piezoelectric photothermal spectroscopy (PPTS) from the viewpoint of nonradiative transition. Stoichiometric and Cu-rich thin film samples were grown on GaAs substrate for the measurements. Among the observed peaks at 1.01, 0.93 and 0.84 eV for the proton irradiated samples at room temperature, two peaks at 1.01 and 0.93 eV were attributed to the free exciton and the intrinsic defect level transitions, respectively. Since the peak at 0.84 eV could not be observed for the sample before irradiation, we considered that this peak was induced by the proton irradiation. Our results indicated that the irradiation-induced Se vacancy played an important role for PPT signal generation. The recovery for the irradiation damage was also observed by this technique. Therefore, we concluded that the PPTS technique was a powerful tool for studying the defect level in the irradiated semiconductor thin films. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:250 / 253
页数:4
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