BaTi4O9 thin films for high-performance metal-insulator-metal capacitors -: art. no. 112902

被引:17
作者
Jang, BY
Kim, BJ
Lee, SJ
Lee, KJ
Nahm, S
Sun, HJ
Lee, HJ
机构
[1] Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
[2] Kunsan Natl Univ, Dept Mat Sci & Engn, Kunsan, South Korea
[3] Korea Res Inst Stand & Sci, New Mat Evaluat Ctr, Taejon 305600, South Korea
关键词
D O I
10.1063/1.2048827
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dielectric and electrical properties of a BaTi4O9 film were investigated in order to evaluate its potential use in metal-insulator-metal (MIM) capacitors for rf/mixed signal integrated circuits. A high capacitance density of 4.62 fF/mu m(2) along with a low tan delta of 0.0025 were obtained at 100 kHz. A high capacitance density of 4.12 fF/mu m(2) and a high quality factor of 322 were also achieved at 2 GHz. The leakage current density was approximately 1 nA/cm(2) at +/- 2 V. Small linear and quadratic voltage coefficients of capacitance of 110 ppm/V and 40.05 ppm/V-2, respectively, and a small temperature coefficient of capacitance of -92.157 ppm/degrees C at 100 kHz were obtained. These results demonstrate that the BaTi4O9 film is a good candidate material for MIM capacitors. (c) 2005 American Institute of Physics.
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页数:3
相关论文
共 16 条
[11]  
JANG BY, IN PRESS J EUR CERAM
[12]   PVD HfO2 for high-precision MIM capacitor applications [J].
Kim, SJ ;
Cho, BJ ;
Li, MF ;
Yu, XF ;
Zhu, CX ;
Chin, A ;
Kwong, DL .
IEEE ELECTRON DEVICE LETTERS, 2003, 24 (06) :387-389
[13]   Effect of microstructures on the microwave dielectric properties of ZrTiO4 thin films [J].
Kim, Y ;
Oh, J ;
Kim, TG ;
Park, B .
APPLIED PHYSICS LETTERS, 2001, 78 (16) :2363-2365
[14]   RF measurement technique for characterizing thin dielectric films [J].
Ma, ZX ;
Becker, AJ ;
Polakos, P ;
Huggins, H ;
Pastalan, J ;
Wu, H ;
Watts, K ;
Wong, YH ;
Mankiewich, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (08) :1811-1816
[15]  
NEGAS T, 1993, AM CERAM SOC BULL, V72, P80
[16]   Very high density RF MIM capacitors (17 fF/μm2 using high-κ Al2O3 doped Ta2O5 dielectrics [J].
Yang, MY ;
Huang, CH ;
Chin, A ;
Zhu, CX ;
Cho, BJ ;
Li, MF ;
Kwong, DL .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2003, 13 (10) :431-433